发明名称 |
SPECTROSCOPIC MICROSCOPE HAVING SPECTROSCOPE FOR MEASURING LUMINOSITY AND WAVELENGTH OF POINT LIGHT SOURCE |
摘要 |
PURPOSE: A spectroscopic microscope having a spectroscope for measuring luminosity and wavelength of a point light source is provided to measure accurately the relative luminosity, the relative wavelength, and the color purity by controlling finely positions of plural point light sources and minimizing light loss. CONSTITUTION: A spectroscopic microscope includes a plurality of object lenses(110-140) and an eyepiece. The object lenses are formed with first to fourth lenses. The first object lens(110) is installed at a predetermined position apart from a target. The second object lens(120) is installed at a predetermined position apart from the first object lens. A first beam splitter is installed between the first object lense and the second object lense. The third object lens(130) is installed at a predetermined position apart from the first beam splitter. A spectroscope(300) is used for measuring a wavelength of light through the third object lens.
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申请公布号 |
KR20040100246(A) |
申请公布日期 |
2004.12.02 |
申请号 |
KR20030032528 |
申请日期 |
2003.05.22 |
申请人 |
JT CO., LTD. |
发明人 |
LEE, BYEONG SIK;LEE, TAE GYEONG;LIM, JIN SU;SHIN, JAE GU;YOO, HONG JUN |
分类号 |
G02B21/00;(IPC1-7):G02B21/00 |
主分类号 |
G02B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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