发明名称 METHOD OF MANUFACTURING RECESS TRANSISTOR WITH UNIFORM CHANNEL LENGTH IN INTEGRATED CIRCUIT DEVICE AND RECESS TRANSISTOR MANUFACTURED THEREBY
摘要 PURPOSE: A method of manufacturing a recess transistor in an IC(Integrated Circuit) device and the recess transistor manufactured thereby are provided to obtain uniform channel length regardless of the position of an active region by levelling substantially a bottom of a gate trench using isotropic dry-etching. CONSTITUTION: An isolation region(140a) for defining an active region is formed in a substrate(100). A gate trench(190) is formed at the active region. A substrate portion(200a) between the gate trench and the isolation region is exposed by using wet-etching. A bottom of the gate trench is planarized by removing the exposed substrate portion using isotropic dry-etching. A recess gate is filled in the gate trench.
申请公布号 KR20040099533(A) 申请公布日期 2004.12.02
申请号 KR20030031547 申请日期 2003.05.19
申请人 发明人
分类号 H01L21/336;H01L21/4763;H01L21/8234;(IPC1-7):H01L21/336 主分类号 H01L21/336
代理机构 代理人
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