发明名称 Self-cleaning method for semiconductor exposure apparatus
摘要 To an original plate holder 16 to which an original pattern plate 15 is set in ordinary exposure, a transmittable plate 20 having a concave-shaped concave portion 22 formed at a middle of a quartz glass plate is set in self-cleaning and irradiated with ultraviolet light emitted from a light source 11. The ultraviolet light is diffused through the concave lens of the transmittable plate 20 and an entire surface of a projection lens 17 is irradiated with it. Accordingly, molecular bonds of a contaminant adhering to the surface of the projection lens 17 are cut off with strong energy of the ultraviolet light, so that the contaminant is decomposed, vaporized, and then removed.
申请公布号 US2004239900(A1) 申请公布日期 2004.12.02
申请号 US20030748240 申请日期 2003.12.31
申请人 AOYAMA RYOICHI;ONODERA TOSHIO;YAMAMOTO YASUHIRO;HOSHINO DAIGO 发明人 AOYAMA RYOICHI;ONODERA TOSHIO;YAMAMOTO YASUHIRO;HOSHINO DAIGO
分类号 G02B3/08;G03F7/20;H01L21/027;H01L21/304;(IPC1-7):G03B27/52 主分类号 G02B3/08
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