发明名称 FIXED ABRASIVE GRAIN POLISHING PAD, AND METHOD OF POLISHING SILICON WAFER USING FIXED ABRASIVE GRAIN POLISHING PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a fixed abrasive grain polishing pad and a method of polishing a silicon wafer using the fixed abrasive grain polishing pad prevented from the detachment of abrasive grains and improved in polishing efficiency. <P>SOLUTION: This fixed abrasive grain polishing pad for polishing the silicon wafer by relative motion to the silicon wafer by pressing the silicon wafer while supplying an alkaline solution as a polishing fluid between the silicon wafer and the polishing pad, is composed of at least a polyurethane binder comprising a hard segment and a soft segment, and abrasive grains having a hydroxyl group, or abrasive grains supplied with the hydroxyl group, wherein the molecular weight of the hard segment is in a range of 20% to 60% of the whole at a molecular weight ratio. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004337992(A) 申请公布日期 2004.12.02
申请号 JP20030133965 申请日期 2003.05.13
申请人 DISCO ABRASIVE SYST LTD 发明人 MIYAZAKI KAZUYA;TSUMAGARI AKIO
分类号 B24B37/20;B24B37/24;B24B37/26;B24D3/00;B24D3/28;B24D11/00;C09K3/14;H01L21/304 主分类号 B24B37/20
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