发明名称 |
Electro luminescence display and method of testing the same |
摘要 |
To increase the proportion of the perfects to the whole lot of final products and to reduce the cost for active matrix EL display devices by checking the operation of a TFT substrate before depositing an EL material. A capacitor for testing is connected to a drain terminal of a driving TFT in a pixel portion to observe charging and discharging of the capacitor. Whether the driving TFT is normal or not is judged by the observation, so that the rejects can be removed before the manufacturing process is completed.
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申请公布号 |
US2004239598(A1) |
申请公布日期 |
2004.12.02 |
申请号 |
US20040866681 |
申请日期 |
2004.06.15 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPAN CORPORATION |
发明人 |
KOYAMA JUN |
分类号 |
G09G3/00;G09G3/32;H01L27/32;(IPC1-7):G09G3/30 |
主分类号 |
G09G3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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