发明名称 CMP apparatus, CMP polishing method, semiconductor device and its manufacturing method
摘要 A CMP apparatus is provided for polishing wafers that are substrates to be polished by CMP. The CMP apparatus comprises a stage that is structured to be rotatable and holds a wafer to be polished, a polishing head holding section that holds a polishing head equipped with a polishing pad over the stage, a polishing head storage section that stores replacement polishing heads equipped with polishing pads; and a polishing head replacement mechanism that replaces the polishing head held by the polishing head holding section with the replacement polishing heads stored in the polishing head storage section.
申请公布号 US2004242126(A1) 申请公布日期 2004.12.02
申请号 US20040803484 申请日期 2004.03.18
申请人 TAKEUCHI JUNICHI 发明人 TAKEUCHI JUNICHI
分类号 B24B37/00;B24B37/04;B24B37/30;B24B57/02;H01L21/304;(IPC1-7):B24B49/00;B24B7/19;B24B1/00 主分类号 B24B37/00
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