| 摘要 |
<p>The present invention provides an down hole apparatus and method for ultrahigh resolution spectroscopy using a tunable diode laser (TDL) for analyzing a formation fluid sample downhole or at the surface to determine formation fluid parameters. In addition to absorption spectroscopy, the present invention can perform Raman spectroscopy on the fluid, by sweeping the wavelength of the TDL and detecting the Raman-scattered light using a narrow-band detector at a fixed wavelength,. The spectrometer analyzes a pressurized well bore fluid sample that is collected downhole. The analysis is performed either downhole or at the surface onsite. Near infrared, mid-infrared and visible light analysis is also performed on the sample to provide an onsite surface or downhole analysis of sample properties and contamination level. The onsite and downhole analysis comprises determination of aromatics, olefins, saturates, gas oil ratio, API gravity and various other parameters which can be estimated by correlation, a trained neural network or a chemometric equation.</p> |
