| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of a working time and the cost in annealing a Ge crystal having decreased resolution, and the problem wherein, when using a Ge detector in an environment having a susceptibility to radiation damage, the resolution is required to be recovered easily in a short time because the resolution recovered once is decreased again by the radiation damage. SOLUTION: A prescribed voltage is applied to the Ge detector damaged by the radiation, and a strong gamma ray source is placed near the detector, and sufficiently many electron/vacancy pairs are generated and taken into lattice defects. Hereby, the detector behaves as if it has no lattice defect, and gamma detection is performed in this state, and energy resolution is temporarily recovered. The defect lasts during application of the voltage. COPYRIGHT: (C)2005,JPO&NCIPI
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