发明名称 |
METHOD AND APPARATUS FOR MEASURING DYNAMIC VISCOELASTICITY |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for easily and efficiently measuring the dynamic viscoelasticity of a minute part of a thin film or a surface of a bulk material. SOLUTION: Periodic distortion is applied to a sample in the direction of thickness thereof. The dynamic viscoelasticity of the sample is measured from an obtained response. COPYRIGHT: (C)2005,JPO&NCIPI
|
申请公布号 |
JP2004333480(A) |
申请公布日期 |
2004.11.25 |
申请号 |
JP20040118675 |
申请日期 |
2004.04.14 |
申请人 |
TORAY RES CENTER:KK |
发明人 |
TAKAHASHI HIDEAKI;ISHIMURO YOSHITAKA |
分类号 |
G01N19/00;(IPC1-7):G01N19/00 |
主分类号 |
G01N19/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|