| 摘要 |
PROBLEM TO BE SOLVED: To quantify the property of reflection prevention of an antireflection film without performing visual inspection. SOLUTION: Slit light is radiated onto the antireflection film 17. The antireflection film 17 with the slit light on is photographed by a CCD camera 14. Based on photograph data, a brightness distribution in a direction perpendicular to the longitudinal direction of the slit is found. A light reduction rate G is found from G=100×(LV0-LV1)/(LV0-LV3), when the light reduction rate is represented as G(%), the width of a center region comprising the center brightness LV0 of the brightness distribution as W, the representative brightness of a first region being 0.5W-1.5W from the center of the center region as LV1, and the representative brightness of a third region being 2.5W-3.5W from the center of the center region as LV3. The center brightness LV0 correlates to an average reflection factor, and the reflection factor G correlates to an evaluated anti-glare value obtained by a conventional visual inspection. The average reflection factor and the evaluated anti-glare value are quantified, and these are obtained from one photometry. COPYRIGHT: (C)2005,JPO&NCIPI
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