发明名称 METHOD FOR MANUFACTURING DUAL GATE FOR CMOS TECHNOLOGY
摘要 PROBLEM TO BE SOLVED: To provide a method and a structure for a method for manufacturing a device having different type transistors. SOLUTION: Gates of different type transistors in a device include different materials. The method comprises the steps of: depositing a silicon layer on a gate insulating layer; depositing a first type gate material on the silicon layer; removing the first type gate material from the region in which a second type gate is formed; depositing a second type gate material on the silicon layer in the region from which the first type gate material has been removed; simultaneously patterning in order to form the first type gate material and the second type gate material into the first type gate and the second type gate; and changing the two type gate materials by annealing. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004336056(A) 申请公布日期 2004.11.25
申请号 JP20040137499 申请日期 2004.05.06
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 CHEN JIA;GRASSMANN ANDREAS E
分类号 H01L21/28;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L21/823 主分类号 H01L21/28
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