发明名称 |
METHOD FOR MANUFACTURING DUAL GATE FOR CMOS TECHNOLOGY |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and a structure for a method for manufacturing a device having different type transistors. SOLUTION: Gates of different type transistors in a device include different materials. The method comprises the steps of: depositing a silicon layer on a gate insulating layer; depositing a first type gate material on the silicon layer; removing the first type gate material from the region in which a second type gate is formed; depositing a second type gate material on the silicon layer in the region from which the first type gate material has been removed; simultaneously patterning in order to form the first type gate material and the second type gate material into the first type gate and the second type gate; and changing the two type gate materials by annealing. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004336056(A) |
申请公布日期 |
2004.11.25 |
申请号 |
JP20040137499 |
申请日期 |
2004.05.06 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
CHEN JIA;GRASSMANN ANDREAS E |
分类号 |
H01L21/28;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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