| 摘要 |
A system and method for detecting defects in TFT-array panels is provided that improves defect detection accuracy by adjusting the thresholding parameters used to classify defective pixels in accordance with the standard deviation of the measured pixel voltages. The present invention is particularly suited for the testing of TFT-array panels that contain more pixels than can be measured by the sensor of the TFT-array tester in a single measurement. The system and method of the present invention calculates a reference pixel voltage at each pixel based on a low frequency component of the measured pixel voltage, and adjusts the thresholding parameters based on the calculated reference pixel voltage.
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