发明名称 Method for dry etching deep trenches in a substrate
摘要 A method for etching trenches in a substrate secures a wafer to an electrode in a plasma chamber and heats the wafer to a temperature of greater than 200 degrees Celsius. The wafer is exposed to a reactive plasma to etch trenches into the substrate of the wafer with minimal redeposition of etch by-products to avoid pinching off the trench and to promote further etching.
申请公布号 US6821900(B2) 申请公布日期 2004.11.23
申请号 US20010757123 申请日期 2001.01.09
申请人 INFINEON TECHNOLOGIES AG;INTERNATIONAL BUSINESS MACHINES 发明人 ATHAVALE SATISH;RANADE RAJIV;NAEEM MUNIR;MATHAD GANGADHARA SWAMI
分类号 H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/311 主分类号 H01L21/302
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