发明名称 |
SINGLE-CRYSTAL SILICON WAFER AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a single-crystal silicon wafer that is made to have gettering ability even against slight amount of contaminations and can be applied to a device manufacturing process, and to provide a method of manufacturing the wafer. SOLUTION: The single-crystal silicon wafer has a structure constituted by successively laminating an intermediate layer and a silicon oxide film in this order on its rear surface. The solubility of the intermediate layer for heavy metal impurities is made larger than that of silicon and smaller than that of the silicon oxide film. COPYRIGHT: (C)2005,JPO&NCIPI
|
申请公布号 |
JP2004327489(A) |
申请公布日期 |
2004.11.18 |
申请号 |
JP20030115968 |
申请日期 |
2003.04.21 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
TOBE TOSHIMI |
分类号 |
H01L21/322;(IPC1-7):H01L21/322 |
主分类号 |
H01L21/322 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|