发明名称 MANUFACTURING METHOD OF MASK FOR FOCUS MONITOR, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a mask for a focus monitor which can form a highly precise monitor mark in a short time by using charged beams. <P>SOLUTION: This manufacturing method comprises a process of forming a first opening and a second opening 21 having a pattern shape corresponding to the first opening and surrounded by a laminated film consisting of a halftone film 2 on a translucent substrate and a light shielding film 3 on the halftone film in the surface region of the translucent substrate 1, and a process of etching the translucent substrate inside the second opening by irradiating an edge part of the second opening, the inside part of the second opening, and the outside part of the second opening with charged beams 52. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004327831(A) 申请公布日期 2004.11.18
申请号 JP20030122339 申请日期 2003.04.25
申请人 TOSHIBA CORP 发明人 KANEMITSU SHINGO;DEWA KYOKO;INOUE SOICHI;ITO SHINICHI;HIRANO TAKASHI
分类号 A61N5/00;G03C5/00;G03F1/26;G03F1/32;G03F1/68;G03F7/20;G03F9/00;G21G5/00;H01L21/027 主分类号 A61N5/00
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