发明名称 |
MANUFACTURING METHOD OF MASK FOR FOCUS MONITOR, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a mask for a focus monitor which can form a highly precise monitor mark in a short time by using charged beams. <P>SOLUTION: This manufacturing method comprises a process of forming a first opening and a second opening 21 having a pattern shape corresponding to the first opening and surrounded by a laminated film consisting of a halftone film 2 on a translucent substrate and a light shielding film 3 on the halftone film in the surface region of the translucent substrate 1, and a process of etching the translucent substrate inside the second opening by irradiating an edge part of the second opening, the inside part of the second opening, and the outside part of the second opening with charged beams 52. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2004327831(A) |
申请公布日期 |
2004.11.18 |
申请号 |
JP20030122339 |
申请日期 |
2003.04.25 |
申请人 |
TOSHIBA CORP |
发明人 |
KANEMITSU SHINGO;DEWA KYOKO;INOUE SOICHI;ITO SHINICHI;HIRANO TAKASHI |
分类号 |
A61N5/00;G03C5/00;G03F1/26;G03F1/32;G03F1/68;G03F7/20;G03F9/00;G21G5/00;H01L21/027 |
主分类号 |
A61N5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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