发明名称 FERROELECTRIC MEMORY DEVICE FOR OBTAINING CONTACT RESISTANCE BETWEEN WIRING AND UPPER ELECTRODE SECURELY, AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A ferroelectric memory device and a manufacturing the same are provided to obtain the contact resistance between a wiring and an upper electrode securely, thereby enhancing reliability and yield of the ferroelectric memory device. CONSTITUTION: A lower electrode is formed over a semiconductor substrate(30). An insulating layer(41) is formed to surround the lower electrode. A ferroelectric layer is formed on the lower electrode and the insulating layer. The ferroelectric layer is partially removed to expose a portion of the lower electrode. An upper electrode(43) is formed on the ferroelectric layer. An inter-insulating layer(44) with a contact hole for exposing the upper electrode layer is formed on the upper electrode. A wiring contact(45) is formed in the contact hole to be connected to the upper electrode. A wiring(46) is formed to connect the upper layer through the wiring contact.
申请公布号 KR20040095955(A) 申请公布日期 2004.11.16
申请号 KR20030026988 申请日期 2003.04.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SEUNG SEOK
分类号 H01L27/105;(IPC1-7):H01L27/105 主分类号 H01L27/105
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