发明名称 |
FERROELECTRIC MEMORY DEVICE FOR OBTAINING CONTACT RESISTANCE BETWEEN WIRING AND UPPER ELECTRODE SECURELY, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A ferroelectric memory device and a manufacturing the same are provided to obtain the contact resistance between a wiring and an upper electrode securely, thereby enhancing reliability and yield of the ferroelectric memory device. CONSTITUTION: A lower electrode is formed over a semiconductor substrate(30). An insulating layer(41) is formed to surround the lower electrode. A ferroelectric layer is formed on the lower electrode and the insulating layer. The ferroelectric layer is partially removed to expose a portion of the lower electrode. An upper electrode(43) is formed on the ferroelectric layer. An inter-insulating layer(44) with a contact hole for exposing the upper electrode layer is formed on the upper electrode. A wiring contact(45) is formed in the contact hole to be connected to the upper electrode. A wiring(46) is formed to connect the upper layer through the wiring contact.
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申请公布号 |
KR20040095955(A) |
申请公布日期 |
2004.11.16 |
申请号 |
KR20030026988 |
申请日期 |
2003.04.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SEUNG SEOK |
分类号 |
H01L27/105;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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