发明名称 Semiconductor device and manufacturing method thereof
摘要 A method for manufacturing a semiconductor device is provided including: a step of forming a solid barrier metal layer on an interlayer insulating film; a removing step of removing at least a part of the solid barrier metal layer located at a place at which a pad opening portion is to be formed; a step of forming a solid second Al alloy film on the interlayer insulating film exposed in the removing step described above and the solid barrier metal layer; a step of patterning the solid second Al alloy film and the solid barrier metal layer so as to form a bonding pad portion on the interlayer insulating film; a step of forming a passivation film on the bonding pad portion and the interlayer insulating film; and a step of forming the pad opening portion in the passivation film at a position located on the bonding pad portion.
申请公布号 US2004222526(A1) 申请公布日期 2004.11.11
申请号 US20040789803 申请日期 2004.02.27
申请人 WADA KOICHI;NAMATAME TATSURU 发明人 WADA KOICHI;NAMATAME TATSURU
分类号 H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L23/485;H01L23/522;H01L23/532;(IPC1-7):H01L23/48;H01L21/476 主分类号 H01L23/52
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