发明名称 Cleaning method and polishing apparatus employing such cleaning method
摘要 A method is suitable for cleaning substrates, after polishing, that require a high degree of cleanliness, such as semiconductor wafers, glass substrates, or liquid crystal displays. The method includes polishing a substrate using an abrasive liquid containing abrasive particles, and cleaning a polished surface of the substrate by supplying a cleaning liquid having substantially the same pH as the abrasive liquid or similar pH to the abrasive liquid so that a pH of the abrasive liquid attached to the polished surface of the substrate is not rapidly changed.
申请公布号 US2004221874(A1) 申请公布日期 2004.11.11
申请号 US20040844317 申请日期 2004.05.13
申请人 WADA YUTAKA;HIYAMA HIROKUNI;KIMURA NORIO 发明人 WADA YUTAKA;HIYAMA HIROKUNI;KIMURA NORIO
分类号 H01L21/304;B08B3/08;B24B53/007;H01L21/00;(IPC1-7):B08B9/00 主分类号 H01L21/304
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