发明名称 CMOS IMAGE SENSOR IMPROVING DARK PROPERTY BY DEFORMING GATE STRUCTURE OF RESET TRANSISTOR AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A CMOS image sensor and a method for manufacturing the same are provided to improve dark property and to easily remove free electrons by deforming a gate structure of a reset transistor. CONSTITUTION: A CMOS image sensor comprises a photodiode(PD), a transfer transistor(Tx), a reset transistor(Rx), a drive transistor(Dx), and a select transistor(Sx). The reset transistor is located at one corner of the photodiode while connecting a power voltage node(VDD). A gate of the reset transistor is partially overlapped with an edge except for the other corner of the photodiode.
申请公布号 KR20040093971(A) 申请公布日期 2004.11.09
申请号 KR20030027859 申请日期 2003.04.30
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 LEE, WON HO
分类号 H01L27/146;(IPC1-7):H01L27/146 主分类号 H01L27/146
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