发明名称 |
SEMICONDUCTOR DEVICE WITH STACKED METAL FILM |
摘要 |
PROBLEM TO BE SOLVED: To improve the characteristics and life of a semiconductor device by enhancing a heat radiation property and reducing a strain and negative external factors caused by the diffusion of impurities. SOLUTION: In the laminate of a crystal growth film and a substrate with the crystal growth film being located above the substrate, electrodes are formed above the laminate or above and below the laminate. The thickness of the electrodes is at least 4μm (preferably, 6μm or above). COPYRIGHT: (C)2005,JPO&NCIPI
|
申请公布号 |
JP2004311678(A) |
申请公布日期 |
2004.11.04 |
申请号 |
JP20030102607 |
申请日期 |
2003.04.07 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YAMADA ATSUSHI;KIDOGUCHI ISAO |
分类号 |
H01L21/28;H01L21/205;H01S5/042;H01S5/323;(IPC1-7):H01S5/042 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|