发明名称 |
Semiconductor device structure facilitating electrostatic discharge protection and manufacturing method thereof |
摘要 |
A structure of a semiconductor device facilitating electrostatic discharge protection at least includes a source terminal, a drain terminal, and a gate terminal, wherein a portion of the source terminal and a portion of the drain terminal are overlapped above the gate terminal to increase the coupling capacitance so that the electrostatic discharge protection device can be turned on quickly. Accordingly the response of the electrostatic discharge protection device to an electrostatic discharge can be effectively promoted.
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申请公布号 |
US2004217424(A1) |
申请公布日期 |
2004.11.04 |
申请号 |
US20040837263 |
申请日期 |
2004.04.30 |
申请人 |
TOPPOLY OPTOELECTRONICS CORP. |
发明人 |
SHIH AN |
分类号 |
H01L21/336;H01L23/60;H01L23/62;H01L27/02;H01L27/12;H01L29/06;H01L29/417;(IPC1-7):H01L23/62 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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