发明名称 PROCESSING SYSTEM AND METHOD FOR THERMALLY TREATING A SUBSTRATE
摘要 A processing system and method for thermally treating a substrate, wherein the processing system comprises a temperature controlled thermal treatment chamber, and a temperature controlled substrate holder for supporting a substrate for thermal treatment. The substrate holder is thermally insulated from the thermal treatment chamber.
申请公布号 WO2004082821(A3) 申请公布日期 2004.11.04
申请号 WO2004US07866 申请日期 2004.03.16
申请人 TOKYO ELECTRON LIMITED;HAMELIN, THOMAS;WALLACE, JAY;LAFLAMME, ARTHUR, H., JR. 发明人 HAMELIN, THOMAS;WALLACE, JAY;LAFLAMME, ARTHUR, H., JR.
分类号 C23C16/44;C25D11/02;H01L21/00;H01L21/677 主分类号 C23C16/44
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