发明名称 Metal film production method
摘要 A metal film production apparatus, comprising: a chamber accommodating a substrate having a barrier metal film of a metal nitride formed thereon: reducing gas supply means for supplying a reducing gas to a site above a surface of the substrate; surface treatment means which reacts the barrier metal film on the surface of the substrate in a reducing gas atmosphere to remove nitrogen atoms in a superficial layer of the barrier metal film, thereby decreasing a nitrogen content of the superficial layer relative to an interior of a matrix of the barrier metal film; a metallic etched member provided in the chamber; source gas supply means for supplying a source gas containing a halogen to an interior of the chamber between the substrate and the etched member; plasma generation means which converts the source gas containing the halogen into a plasma to generate a source gas plasma so that the etched member is etched with the source gas plasma to form a precursor from a metal component contained in the etched member and the source gas; and control means which makes a temperature of the substrate lower than a temperature of the etched member to form the metal component of the precursor as a film on the barrier metal film having the nitrogen content of the superficial layer relatively decreased.
申请公布号 EP1473380(A2) 申请公布日期 2004.11.03
申请号 EP20040017497 申请日期 2002.10.28
申请人 MITSUBISHI HEAVY INDUSTRIES, LTD. 发明人 SAKAMOTO, HITOSHI;YAHATA, NAOKI;MATSUDA, RYUICHI;YOSHIYUKI, OOBA;NISHIMORI, TOSHIHIKO
分类号 H01L21/28;C23C8/36;C23C16/34;C23C16/448;C23C16/452;C23C16/507;C23C16/56;C23C28/00;C23C30/00;H01L21/768;(IPC1-7):C23C14/00;C23C14/06;C23C28/02;C23C14/16;C23C14/02 主分类号 H01L21/28
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