发明名称 Narrow fins by oxidation in double-gate finfet
摘要 A method of forming fins for a double-gate fin field effect transistor (FinFET) includes forming a second layer of semi-conducting material over a first layer of semi-conducting material and forming double caps in the second layer of semi-conducting material. The method further includes forming spacers adjacent sides of each of the double caps and forming double fins in the first layer of semi-conducting material beneath the double caps. The method also includes thinning the double fins to produce narrow double fins.
申请公布号 US6812119(B1) 申请公布日期 2004.11.02
申请号 US20030614052 申请日期 2003.07.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 AHMED SHIBLY S.;LIN MING-REN;WANG HAIHONG;YU BIN
分类号 H01L21/3205;H01L21/336;H01L21/4763;H01L29/786;(IPC1-7):H01L21/320;H01L21/476 主分类号 H01L21/3205
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