ALIGNMENT FEATURES IN A PROBING DEVICE

摘要

An image of an array of probes is searched for alignment features. The alignment features are then used to bring contact targets and the probes into contact with one another. The alignment features may be a feature of one or more of the tips of the probes. For example, such a feature may be a corner (462b) of one of the tips. An array of probes may be formed to have such alignment features.