| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of a low resolution of about 9 bits although A/D converter elements are disposed on columns and parallel operated for high-speed A/D conversion in a CMOS image sensor. SOLUTION: As the A/D converter for the image sensor, a part of functions of A/D conversion is performed by using a column noise cancel circuit and amplification is simultaneously performed, thereby high-resolution A/D conversion is realized together with subsequence A/D conversion parts while improving a signal-to-noise ratio (SNR). COPYRIGHT: (C)2005,JPO&NCIPI
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