| 摘要 |
PROBLEM TO BE SOLVED: To obtain an low-cost infrared camera by which the provision of a data table related to the relation between a bias voltage and an output offset voltage at each operating temperature is eliminated to reduce the man-hour of test adjustment. SOLUTION: The infrared camera provided with a calibrating infrared incidence means allowing the incidence of a calibrating infrared ray with equal intensity on each detection element composing the light receiving surface of an infrared imaging element in calibration, a bias voltage adjustment circuit applying a timewisely changed bias voltage to the infrared imaging element at the time of the incidence of the calibrating infrared ray, and an element output level detection circuit averaging an output voltage from the infrared imaging element at the time of the incidence of the calibrating infrared ray. The bias voltage adjustment circuit stores a bias voltage value at the moment when an averaged output voltage level reaches a target value and sets an output offset level after releasing the incidence of the calibrating infrared ray based on the stored bias voltage value. COPYRIGHT: (C)2005,JPO&NCIPI
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