发明名称 Solid-state imaging apparatus with reduced leakage and noise
摘要 <p>A solid-state imaging apparatus 100 includes a plurality of photosensitive cells 8, and a driving unit provided for driving the plurality of photosensitive cells 8. Each photosensitive cell 8 includes a photodiode 5 formed to be exposed on a surface of a semiconductor substrate for the purpose of accumulating signal charge obtained by subjecting incident light to photoelectric conversion, a transfer transistor for transferring signal charge accumulated by the photodiode 5, a floating diffusion layer 1 for temporarily accumulating signal charge transferred by the transfer transistor, and an amplifier transistor 2 for amplifying signal charge temporarily accumulated in the floating diffusion layer 1. A source/drain diffusion layer 3 provided in the amplifier transistor 2 is covered with a salicide layer 4, and the floating diffusion layer 1 is formed to be exposed on a surface of the semiconductor substrate.</p>
申请公布号 EP1471579(A2) 申请公布日期 2004.10.27
申请号 EP20040006852 申请日期 2004.03.22
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD 发明人 UCHIDA, MIKIYA;MATSUNAGA, YOSHIYUKI;INAGAKI, MAKOTO
分类号 H01L27/146;H01L27/148;H01L31/10;H04N5/335;H04N5/357;H04N5/369;H04N5/374;(IPC1-7):H01L27/146 主分类号 H01L27/146
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