发明名称 |
Solid-state imaging apparatus with reduced leakage and noise |
摘要 |
<p>A solid-state imaging apparatus 100 includes a plurality of photosensitive cells 8, and a driving unit provided for driving the plurality of photosensitive cells 8. Each photosensitive cell 8 includes a photodiode 5 formed to be exposed on a surface of a semiconductor substrate for the purpose of accumulating signal charge obtained by subjecting incident light to photoelectric conversion, a transfer transistor for transferring signal charge accumulated by the photodiode 5, a floating diffusion layer 1 for temporarily accumulating signal charge transferred by the transfer transistor, and an amplifier transistor 2 for amplifying signal charge temporarily accumulated in the floating diffusion layer 1. A source/drain diffusion layer 3 provided in the amplifier transistor 2 is covered with a salicide layer 4, and the floating diffusion layer 1 is formed to be exposed on a surface of the semiconductor substrate.</p> |
申请公布号 |
EP1471579(A2) |
申请公布日期 |
2004.10.27 |
申请号 |
EP20040006852 |
申请日期 |
2004.03.22 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD |
发明人 |
UCHIDA, MIKIYA;MATSUNAGA, YOSHIYUKI;INAGAKI, MAKOTO |
分类号 |
H01L27/146;H01L27/148;H01L31/10;H04N5/335;H04N5/357;H04N5/369;H04N5/374;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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