发明名称 Method of producing a thin layer of semiconductor material
摘要 The invention relates to a method of producing a thin layer of semiconductor material including:a step of implanting ions through a flat face (2) of a semiconductor wafer in order to create a layer of microcavities, the ion dose being within a specific range in order to avoid the formation of blisters on the flat face,a thermal treatment step in order to achieve coalescence of the microcavitiesa possibly, a step of creating at least one electronic component (5) in the thin layer (6),a separation step of separating the thin layer (6) from the rest (7) of the wafer.
申请公布号 US6809009(B2) 申请公布日期 2004.10.26
申请号 US20010777516 申请日期 2001.02.06
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 ASPAR BERNARD;BRUEL MICHEL;POUMEYROL THIERRY
分类号 H01L21/265;H01L21/02;H01L21/304;H01L21/762;H01L27/12;(IPC1-7):H01L21/302 主分类号 H01L21/265
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