DELAY CONTROL CIRCUIT OF SEMICONDUCTOR DEVICE, ESPECIALLY OBTAINING HIGH ACCURACY OF A SIGNAL DELAY TEST

摘要

PURPOSE: A delay control circuit of a semiconductor device is provided, which achieves high accuracy of a signal delay test related to the operation of the semiconductor device and makes delay through a normal operation path equal to delay through pad input. CONSTITUTION: A triple delay control circuit comprises a replica pad delay block(20) providing delay corresponding to delay from a pad to an input(B). A signal inputted through a normal operation path(P1) goes through the replica pad delay block so that signal delay through the normal operation path is equal to signal delay through the pad input. A switching block(18) selects one of inputs(A,B) by a pad control signal.