发明名称 Methods and devices for measuring fundamental data of lenses
摘要 A measurement device may illuminate lens 10 to be inspected with light at a plurality of different angles of incidence. The transmitted light that passes through lens 10 may be preferably detected by light detecting means 36. When light detecting means 36 detects the light, it outputs an electrical signal. Control unit 54 may (1) align light source 22 in the predetermined position and turns it on and (2) calculate the degree of refraction of the transmitted light that passes through lens 10, based upon the electrical signal output from light detecting means 36. Then, control unit 54 may further (3) conduct illumination at a plurality of different angles of incidence and obtain a plurality of "angle of incidence-degree of refraction" relationships from the degree of refraction calculated for each angle of incidence, and (4) calculate the fundamental data of lens 10 by using the plurality of "angle of incidence-degree of refraction" relationships.
申请公布号 US2004207834(A1) 申请公布日期 2004.10.21
申请号 US20040824356 申请日期 2004.04.15
申请人 SUZUKI TOSHIYUKI 发明人 SUZUKI TOSHIYUKI
分类号 G01M11/00;G01M11/02;G02C7/02;(IPC1-7):G01B11/02 主分类号 G01M11/00
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