发明名称 Flexible and extensible implementation of sharing test pins in ASIC
摘要 A library to be used in an ASIC design system includes information to be used for verification of test structures. The library includes information regarding the ability to combine test pins for verification of the test structure and information regarding the sharing of ports for verification of the test structure. A user of the ASIC design system can include custom test structures in the library for verification.
申请公布号 US2004210806(A1) 申请公布日期 2004.10.21
申请号 US20030441000 申请日期 2003.05.19
申请人 GOYAL SAKET K. 发明人 GOYAL SAKET K.
分类号 G01R31/28;G06F11/00;G06F17/50;H02H3/05;(IPC1-7):G01R31/28 主分类号 G01R31/28
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