发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE TO PREVENT LIFTING BETWEEN DIELECTRIC FILM AND UPPER ELECTRODE |
摘要 |
PURPOSE: A method for forming a semiconductor device is provided to previously prevent lifting between a dielectric film and an upper electrode by exposing an overlap mark block using a mask with a clear box. CONSTITUTION: A lower electrode of a capacitor is formed on a semiconductor substrate. A dielectric film and an upper electrode are sequentially deposited on the resultant structure including a mark block. The upper electrode and the dielectric film are patterned by using a mask(31), wherein the mask is provided with a clear box(35) for removing the upper electrode and the dielectric film of the mark block.
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申请公布号 |
KR20040087395(A) |
申请公布日期 |
2004.10.14 |
申请号 |
KR20030021602 |
申请日期 |
2003.04.07 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
EOM, TAE SEUNG;OH, SE YEONG |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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