发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE TO PREVENT LIFTING BETWEEN DIELECTRIC FILM AND UPPER ELECTRODE
摘要 PURPOSE: A method for forming a semiconductor device is provided to previously prevent lifting between a dielectric film and an upper electrode by exposing an overlap mark block using a mask with a clear box. CONSTITUTION: A lower electrode of a capacitor is formed on a semiconductor substrate. A dielectric film and an upper electrode are sequentially deposited on the resultant structure including a mark block. The upper electrode and the dielectric film are patterned by using a mask(31), wherein the mask is provided with a clear box(35) for removing the upper electrode and the dielectric film of the mark block.
申请公布号 KR20040087395(A) 申请公布日期 2004.10.14
申请号 KR20030021602 申请日期 2003.04.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 EOM, TAE SEUNG;OH, SE YEONG
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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