发明名称 SUBSTRATE WASHING DEVICE, SUBSTRATE WASHING METHOD, AND METHOD FOR MANUFACTURING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To suppress the occurrence of unevenness in processing such as etching and developing, on the surface of a substrate. SOLUTION: The substrate 1 to the surface of which etching liquid, a developer, or the like, is applied is washed while the substrate is moved in a substrate moving direction by means of rollers 2a in a washing tank. A plurality of nozzles 4a are downwardly attached to a nozzle header 3a diagonally in the substrate moving direction. On the other hand, a plurality of nozzles 4b are downwardly attached to a nozzle header 3b diagonally in the direction opposite to the substrate moving direction. The respective nozzles 4b of the nozzle header 3b are arranged in the middle positions of the respective nozzles 4a. Washing liquid 5a discharged from the nozzles 4a and washing liquid 5b discharged from the nozzles 4b are supplied to a same range in the substrate moving direction on the surface of the substrate 1. Nozzle headers 3c and 3d play the same role. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004275918(A) 申请公布日期 2004.10.07
申请号 JP20030072172 申请日期 2003.03.17
申请人 HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO LTD 发明人 IZAKI MAKOTO
分类号 B08B3/02;B05C11/10;B05D1/02;H01L21/027;H01L21/306;(IPC1-7):B08B3/02 主分类号 B08B3/02
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