发明名称 CIRCUIT FOR GENERATING PHASE COMPARISON SIGNAL, IN WHICH EXTERNAL CLOCK PREVIOUS TO N-1 TH EXTERNAL CLOCK IS DELAY
摘要 PURPOSE: A circuit for generating a phase comparison signal is provided to remove the limit of the least clock period due to a delay period of the shortest output path by delaying a previous external clock. CONSTITUTION: A first frequency divider(411) is used for receiving a clock signal and dividing the clock signal. A second frequency divider(412) is used for receiving and dividing an output signal of the first frequency divider. A third frequency divider(413) is used for receiving and dividing an output signal of the second frequency divider. A first NAND gate(414) is used for performing a NAND operation for the output signal of the second frequency divider and an output signal of the third frequency divider and outputting a result signal as a phase comparison reference signal. A first inverter(415) is used for inverting an output signal of the first NAND gate.
申请公布号 KR20040084513(A) 申请公布日期 2004.10.06
申请号 KR20030019646 申请日期 2003.03.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, IN CHEOL
分类号 H03L7/081;(IPC1-7):H03L7/08 主分类号 H03L7/081
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