发明名称 |
METHOD FOR FORMING POLYCRYSTALLINE SILICON LAYER USING NICKEL ALLOY LAYER AND TFT FABRICATION METHOD USING THE SAME TO SHORTEN CRYSTALLIZATION PERIOD |
摘要 |
PURPOSE: A method for forming a polycrystalline silicon layer using a nickel alloy layer and a TFT fabrication method using the same are provided to shorten a crystallization period by using Ni alloy including Pd or Co as a metal layer. CONSTITUTION: An amorphous silicon layer(2) is formed on an insulating substrate(1). A channel region and the first and the second regions are formed by patterning the amorphous silicon layer. A gate insulating layer and a gate electrode are formed on the channel region. A metal layer(6) as an Ni alloy layer including Pd or Co is formed on the entire surface of the substrate. An ion implantation process is performed on the substrate. A thermal process is performed under the low temperature. The first and the second regions are crystallized by a MIC method. The channel region is crystallized by a MILC method.
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申请公布号 |
KR20040084392(A) |
申请公布日期 |
2004.10.06 |
申请号 |
KR20030019433 |
申请日期 |
2003.03.28 |
申请人 |
JOO, SEUNG GI |
发明人 |
JOO, SEUNG GI;KIM, GI BEOM;KIM, MIN SEON;YOON, YEO GEON |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
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地址 |
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