发明名称 NEEDLE FOR USE IN PROBE CARD, IN WHICH A CONDUCTIVE THIN FILM IS MANUFACTURED BY AN ETCHING PROCESS
摘要 PURPOSE: A needle for use in a probe card is provided to drastically improve the reliability of the test by minimizing the contact area in the test pad and supplying a uniform and stable connection with the test pad. CONSTITUTION: A needle for use in a probe card includes a body(50), a contact end(51) and a connection part(52). The body(50) is in the form of rectangular and is formed by patterning the conductive thin film having a predetermined thickness. The thickness of the contact end(51) decreases at side by etching both side of the body(50) and the bottom portion of the contact end(51) is a tapered shape. And, the connection part(52) has the same thickness of the conductive thin film from the top portion of the contact end(51) with a predetermined inclined angle.
申请公布号 KR20040082745(A) 申请公布日期 2004.09.30
申请号 KR20030017397 申请日期 2003.03.20
申请人 YULIM HITECH., INC. 发明人 JUN, TAE UN
分类号 G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R1/067
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