发明名称 LDMOS high frequency transistor, has channel and resurf zone arranged in well under gate electrode, between source zone and drain zone
摘要 The transistor has a semiconductor material (11) of a first conductivity type on a substrate (10). A gate electrode (12) is arranged over the semiconductor material. A well (15) of a second conductivity type. A source zone (16) of a first conductivity type is arranged in the well on one side of the gate electrode. A drain zone (17) of a first conductivity type is arranged in the semiconductor material outside the well on the other side of the gate electrode. A channel (18) is arranged in the well under the gate electrode, between the source zone and the drain zone. A resurf zone (19) of a first conductivity type is arranged in the well between the source zone and the drain zone. An independent claim is included for a method of manufacturing an LDMOS high frequency transistor.
申请公布号 DE10309613(A1) 申请公布日期 2004.09.30
申请号 DE2003109613 申请日期 2003.03.05
申请人 INFINEON TECHNOLOGIES AG 发明人 TADDIKEN, HANS
分类号 H01L29/06;H01L29/08;H01L29/10;H01L29/417;H01L29/78 主分类号 H01L29/06
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