发明名称 STRUCTURE AND METHOD FOR BONDING TO COPPER INTERCONNECT STRUCTURES
摘要 An integrated circuit structure and a method for fabricating the structure. The method comprises forming a copper bond pad for attaching the integrated circuit to a package. Copper oxide is removed from the pad by reduction in a hydrogen ion atmosphere. For attaching the integrated circuit to a bump-bonding package an under-bump metallization layer is formed over the reduced copper pad and a solder bump formed thereover. The process can also be employed in a wire bonding process by forming an aluminum layer overlying the cleaned copper pad. The structure of the present invention comprises a copper pad formed in a substrate. A passivation layer defining an opening therein overlies the copper pad. A under-bump metallization layer is disposed in the opening and a solder bump overlies the metallization layer. Alternatively, the structure further comprises an aluminum pad disposed overlying the reduced copper pad.
申请公布号 WO2004059708(A3) 申请公布日期 2004.09.30
申请号 WO2003US41821 申请日期 2003.12.19
申请人 AGERE SYSTEMS INC. 发明人 BACHMAN, MARK, ADAM;CHESIRE, DANIEL, PATRICK;MERCHANT, SAILESH, MANSINH
分类号 B23K35/14;H01L21/02;H01L21/311;H01L21/3213;H01L21/60;H01L23/485 主分类号 B23K35/14
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