发明名称 |
METHOD FOR FORMING MULTI-TRENCH OF SEMICONDUCTOR DEVICE TO EASILY CONTROL RESISTANCE AND THRESHOLD VOLTAGE |
摘要 |
PURPOSE: A method for forming a multi-trench of a semiconductor device is provided to easily control resistance and threshold voltage by using a plurality of trenches having different depth. CONSTITUTION: A hard mask composed of an oxide layer(12) and a nitride layer(14) is formed on a wafer(10). The first hard mask pattern with the first opening part is formed using the first photoresist pattern. The first trench(24) with a relatively deep depth is formed by selectively etching the wafer using the first hard mask pattern as a mask. The second hard mask pattern with the second opening part is formed using the second photoresist pattern as a mask. The second trench(32) with a relatively shallow depth is formed by using the second hard mask pattern as a mask.
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申请公布号 |
KR20040082219(A) |
申请公布日期 |
2004.09.24 |
申请号 |
KR20030016909 |
申请日期 |
2003.03.18 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
KIM, HAN JIN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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