发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit where the malfunction of the circuit due to the drop of power voltage can be prevented, which cannot be dissolved even if power reinforcing measures in an arrangement wiring process is taken in one chip. <P>SOLUTION: The semiconductor integrated circuit comprises (a) a semiconductor chip 1 where wiring for supplying power potential of a high potential-side is formed, (b) a semiconductor chip 2 where wiring for supplying power potential of a low potential-side is formed, and (c) a semiconductor chip 3 including a semiconductor substrate 30, a first group of electrodes 39a which are formed on a first face of the semiconductor substrate and are electrically connected to wiring of the semiconductor chip 1, a second group of electrodes 35b which are formed on a second face of the semiconductor substrate and are electrically connected to wiring of the semiconductor chip 2 and a plurality of circuit elements to which power potential of the high potential-side is supplied from the first group of the electrodes and to which power potential of the low potential-side is supplied from the second group of the electrodes and are operated. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004266065(A) 申请公布日期 2004.09.24
申请号 JP20030054006 申请日期 2003.02.28
申请人 SEIKO EPSON CORP 发明人 YOSHIKAWA HIDEAKI
分类号 H01L23/52;(IPC1-7):H01L23/52 主分类号 H01L23/52
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