发明名称 METHOD FOR MANUFACTURING FLASH MEMORY DEVICE TO PREVENT DAMAGE OF SUBSTRATE AND MISALIGNMENT OF DUMMY PATTERN
摘要 PURPOSE: A method for manufacturing a flash memory device is provided to prevent damage of a substrate and misalignment of a dummy pattern by removing outmost dummy pattern of cell patterns. CONSTITUTION: A tunnel oxide layer(112), the first polysilicon layer(114) and a pad nitride layer are sequentially formed on a substrate(110) defined with a cell region(A) and a dummy region(B). A trench isolation layer(118) is formed in the substrate. The pad nitride layer is removed and the second polysilicon layer(120) is formed on the resultant structure. By patterning the second polysilicon layer, a floating gate is formed on the cell region and the second polysilicon layer remains on the dummy region.
申请公布号 KR20040081244(A) 申请公布日期 2004.09.21
申请号 KR20030015978 申请日期 2003.03.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SIM, GWI HWANG;WOO, SEONG SU
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
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