| 摘要 |
The invention discloses a time-of-flight method and apparatus for rapid and high resolution measurement of the optical characteristics of a set of superimposed thin layers within an object, penetrated by an illuminating beam of light. The very high temporal, spectral and spatial resolutions are obtained by illuminating the object with a femtosecond laser and collecting the data characteristic of the different layers simultaneously, by sampling the scattered radiation in the time domain, using a chain of linked non-linear gates.
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