发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device includes an effective pattern region and at least one measurement mark region. The measurement mark region includes a measuring objective portion. The measuring objective portion has the same shape as a portion forming part of the effective pattern region.
申请公布号 US6794763(B2) 申请公布日期 2004.09.21
申请号 US20020290091 申请日期 2002.11.06
申请人 SEIKO EPSON CORPORATION 发明人 TOMOHIRO YASUHIKO
分类号 G03F7/40;H01L21/027;H01L21/3205;H01L21/66;H01L21/82;H01L23/52;H01L23/544;(IPC1-7):H01L23/544 主分类号 G03F7/40
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