发明名称 Use of irregularly shaped conductive filler features to improve planarization of the conductive layer while reducing parasitic capacitance introduced by the filler features
摘要 A fabricated multiple layer integrated circuit in which adequate planarization is accomplished using irregularly shaped and properly spaced conductive filler features that are spaced in such a way that capacitive coupling of the conductive filler features with the active conductive regions is reduced. The overall layout area of the conductive filler features is reduced to thereby reduced capacitive coupling with active conductive above and below. In addition, a relatively small edge of the feature is closest to the active conductive in the same conductive layer thereby further reducing capacitive coupling.
申请公布号 US6794691(B2) 申请公布日期 2004.09.21
申请号 US20030348093 申请日期 2003.01.21
申请人 AMI SEMICONDUCTOR, INC. 发明人 NELSON MARK MICHAEL
分类号 H01L21/3105;H01L23/528;H01L23/544;(IPC1-7):H01L29/73 主分类号 H01L21/3105
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