发明名称 |
SEMICONDUCTOR DEVICE WITH DUAL GATE SPACER AND MANUFACTURING METHOD THEREOF TO REDUCE RESISTANCE |
摘要 |
PURPOSE: A semiconductor device with a dual gate spacer and a manufacturing method thereof are provided to reduce resistance and to obtain high-speed operation and good data-resolution by forming the gate spacer on an etch stop layer to increase the contact area between a conductive pad and a substrate. CONSTITUTION: A plurality of gate patterns are formed on a semiconductor substrate(50). An etch stop layer(56) is formed on the resultant structure. A lower spacer(62) and an upper spacer(60) are vertically stacked at sidewalls of the gate patterns with the etch stop layer. An interlayer dielectric(64) is formed on the resultant structure. A conductive pad(68) is formed to connect the substrate through the interlayer dielectric and the etch stop layer.
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申请公布号 |
KR20040080790(A) |
申请公布日期 |
2004.09.20 |
申请号 |
KR20030015767 |
申请日期 |
2003.03.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JI YEONG |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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