发明名称 SEMICONDUCTOR DEVICE WITH DUAL GATE SPACER AND MANUFACTURING METHOD THEREOF TO REDUCE RESISTANCE
摘要 PURPOSE: A semiconductor device with a dual gate spacer and a manufacturing method thereof are provided to reduce resistance and to obtain high-speed operation and good data-resolution by forming the gate spacer on an etch stop layer to increase the contact area between a conductive pad and a substrate. CONSTITUTION: A plurality of gate patterns are formed on a semiconductor substrate(50). An etch stop layer(56) is formed on the resultant structure. A lower spacer(62) and an upper spacer(60) are vertically stacked at sidewalls of the gate patterns with the etch stop layer. An interlayer dielectric(64) is formed on the resultant structure. A conductive pad(68) is formed to connect the substrate through the interlayer dielectric and the etch stop layer.
申请公布号 KR20040080790(A) 申请公布日期 2004.09.20
申请号 KR20030015767 申请日期 2003.03.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JI YEONG
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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