| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which suppresses and reduces an increase in the delay of a test signal interconnected along a chip periphery and the deterioration of a waveform dullness, can adjust the delay, and is suitable for applying to ASIC, etc. SOLUTION: A chip peripheral part has a region (called the "I/O region") for arranging I/O cells (11, 12, 13), a signal wiring for propagating the test signal to a plurality of the I/O cells is provided along a layout direction of the I/O cells, at least one empty cell (16, 17) of the empty cells not provided with the I/O cells of the I/O region configures a propagation path of the signal, and a repeater circuit 25 for receiving the signal to drive to output it is provided. COPYRIGHT: (C)2004,JPO&NCIPI |
