发明名称 |
Online material consumption monitoring system and method for monitoring material within a wafer fabrication facility |
摘要 |
An online monitoring system is provided having a computer having a GUI having a build of material display; a material warehouse in communication with a manufacturing execution system ("MES") for controlling execution of a plurality of recipes used to make an associated product; a capacity consumption system ("CCS") for determining future processing capacity within a wafer fabrication facility in accordance with a total material consumption algorithm. A method of use having the steps of: providing a representative material for consumption within a fabrication facility; calculating a total amount of the representative material consumed within a wafer fabrication facility in accordance with a material consumption algorithm, wherein the material consumption algorithm is calculated using a plurality of variables; and benchmarking material usage by each piece of fabrication equipment disposed within one or a plurality of fabrication facilities to help plan for future material usage and to improve fabrication production.
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申请公布号 |
US2004181371(A1) |
申请公布日期 |
2004.09.16 |
申请号 |
US20030387071 |
申请日期 |
2003.03.12 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
HUANG ALLISON;LIN CHIH-TSONG |
分类号 |
G06F11/00;G06F11/34;G06F15/00;(IPC1-7):G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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