发明名称 Online material consumption monitoring system and method for monitoring material within a wafer fabrication facility
摘要 An online monitoring system is provided having a computer having a GUI having a build of material display; a material warehouse in communication with a manufacturing execution system ("MES") for controlling execution of a plurality of recipes used to make an associated product; a capacity consumption system ("CCS") for determining future processing capacity within a wafer fabrication facility in accordance with a total material consumption algorithm. A method of use having the steps of: providing a representative material for consumption within a fabrication facility; calculating a total amount of the representative material consumed within a wafer fabrication facility in accordance with a material consumption algorithm, wherein the material consumption algorithm is calculated using a plurality of variables; and benchmarking material usage by each piece of fabrication equipment disposed within one or a plurality of fabrication facilities to help plan for future material usage and to improve fabrication production.
申请公布号 US2004181371(A1) 申请公布日期 2004.09.16
申请号 US20030387071 申请日期 2003.03.12
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 HUANG ALLISON;LIN CHIH-TSONG
分类号 G06F11/00;G06F11/34;G06F15/00;(IPC1-7):G06F11/00 主分类号 G06F11/00
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