发明名称 SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, ELECTRONIC APPARATUS, PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE AND PROCESS FOR FABRICATING ELECTRONIC DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device, an electronic device and an electronic apparatus in which damage on a connecting terminal can be prevented when an electrode is bonded, and to provide a process for fabricating a semiconductor device and a process for fabricating the electronic device. <P>SOLUTION: The connecting terminal 2 is provided with a region 2a wider than a wiring part 2' and a region 2b narrower than the region 2a. While the side end 4a of the electrode 4 is arranged on the region 2a and the side end 4b opposing the side end 4a is arranged on the region 2b, the electrode 4 is bonded onto the connecting terminal 2. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004259887(A) 申请公布日期 2004.09.16
申请号 JP20030047930 申请日期 2003.02.25
申请人 SEIKO EPSON CORP 发明人 YUZAWA HIDEKI
分类号 H01L23/12;H01L21/60;(IPC1-7):H01L23/12 主分类号 H01L23/12
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