发明名称 SEMICONDUCTOR ELEMENT AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element having an electrode structure of high etching resistance and provide a method for manufacturing the semiconductor element. SOLUTION: A semiconductor base body 2 for a diode chip 1 is constituted of an n<SP>+</SP>-type semiconductor area 5, an n-type semiconductor area 6, and a p<SP>+</SP>-type semiconductor area 7. In addition to n-type impurities, p-type impurities of low concentration are contained in the n<SP>+</SP>-type semiconductor area 5. Metallic layers consisting of nickel are respectively formed on the surfaces of the n<SP>+</SP>-type semiconductor area 5 and the p<SP>+</SP>-type semiconductor area 7 and the metallic layers are treated with heat to form 1st and 2nd silicide layers 11, 13. In addition to silicon and nickel, n-type impurities and p-type impurities are contained in the 1st silicide layer 11. Silicon, nickel and the p-type impurities are contained in the 2nd silicide layer 13. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004260006(A) 申请公布日期 2004.09.16
申请号 JP20030049982 申请日期 2003.02.26
申请人 SANKEN ELECTRIC CO LTD 发明人 ANDO HIDEYUKI
分类号 H01L21/28;H01L21/329;H01L29/43;H01L29/861;(IPC1-7):H01L21/28 主分类号 H01L21/28
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